Intel has announced a quantum testing device, called a cryoprober, that it said can measure quantum chips (qubits), and gather information in minutes on sources of quantum noise and the quality of ...

I’ve had a fairly varied early part of my career in the semiconductors business: a series of events caused me to jump disciplines a little bit, and after one such event, I landed in the test ...

FormFactor has introduced the PH150XP wafer probe card, an extension of the company's PH150 product family for DRAM wafer testing. The PH150XP offers several yield and throughput enhancements to ...

I’ve had a fairly varied early part of my career in the semiconductors business: a series of events caused me to jump disciplines a little bit, and after one such event, I landed in the test ...

In this interview, Jeremy Hope from Wentworth Laboratories talks to AZoM about why they are attending electronica. Please tell us about the company Wentworth Labs and why you are attending electronica ...

Wafer inspection has become a critical part of the semiconductor manufacturing process. Inspections performed after wafer test can analyze the marks left by probe cards to ensure that the test process ...

NORTH READING, Mass.--(BUSINESS WIRE)-- Teradyne, a leading provider of automated test equipment, has partnered with ficonTEC, a global leader in production solutions for photonics assembly and test, ...