This chapter will discuss the many aspects of production testing for wireless SOC devices. Highly integrated wireless SOC devices must supplement the traditional parasitic testing (power, phase noise, ...
Complex system-on-chip (SoC) devices make every stage of the development flow harder, and the challenges continue even after the silicon is fabricated. Automatic test equipment (ATE) screening for ...
September 11, 2013. Synopsys Inc. has announced the availability of its DesignWare STAR Hierarchical System, an automated hierarchical test solution for efficiently testing SoCs, including ...
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