The software connects Tessent-generated test patterns with execution environments, including automated test equipment, system ...

Handling timing exception paths in ATPG tools while creating at-speed patterns has always been a tough and tricky task. It is well understood that at-speed testing is a requirement for modern ...

[Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based development board to output different test patterns in PAL/NTSC. If one is checking ...

The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested.

RPA vs. test automation: What are the differences? The terms test automation and RPA are often interchanged, and one might wonder if both are used for the same purposes or share the same tools. This ...